Nanoparticles and Nanometric Systems Characterization Center
The Russell Berrie Nanotechnology Characterization Center provides access to and support for a wide range of characterization methods for nanometric and colloidal systems.
The Center offers a broad range of services to Technion researchers, including research activities and support for academic teaching, as well as services for industrial companies and other private institutions.
The Center houses a wide range of equipment for conducting analyses in various fields, including:
- Particle size analysis: Using dynamic light scattering (DLS) and laser diffraction techniques.
- Thermal analysis: Calorimetric measurements using DSC (Differential Scanning Calorimetry).
- Mechanical testing: Universal tensile/compression testing machine, micro-compression tester, and rheometer.
- Microstructure characterization: X-ray diffraction (XRD), enabling identification of the molecular and atomic arrangement of crystalline materials within the crystal structure.
- AFM: Atomic Force Microscopy for surface characterization of complex systems and materials at atomic-scale resolution, with the option to operate in a liquid environment.
- Spectroscopy: A dual-monochromator-based plate reader will soon be available, supporting three measurement modes across the following spectral ranges:
- Abs: 200–1000 nm
- FL (top and bottom): 200–1000 nm
- LUM: 360–670 nm
Contact us:
Dr. Sigal Eichler
Phone: +972-73-3781936
E-mail: nnscc@technion.ac.il
